DocumentCode :
1338398
Title :
Nanometer-scale copper electrodeposition from an on-chip source
Author :
Wu, Mingshaw W. ; Sohn, Lydia L.
Author_Institution :
Dept. of Phys., Princeton Univ., NJ, USA
Volume :
21
Issue :
6
fYear :
2000
fDate :
6/1/2000 12:00:00 AM
Firstpage :
277
Lastpage :
279
Abstract :
Using both an on-chip anode as a source of copper and a copper-free, acidic electroplating solution, we have fabricated electrodes with separations on the order of 10 nm or less. During the electrodeposition process, we observe steplike increases in conductance, corresponding to atomic rearrangement. These conductance steps indicate that the separation between the electrodes is on the atomic length scale. Applications of this technique include the fabrication of electrodes with nanometer separations and the repair of both malformed bus lines and damaged masks.
Keywords :
copper; electrochemical electrodes; electrodeposition; integrated circuit interconnections; metallisation; microelectrodes; nanotechnology; 10 nm; Cu; Cu-free acidic electroplating solution; damaged mask repair; electrode fabrication; malformed bus line repair; nanometer separations; nanometer-scale Cu electrodeposition; onchip Cu source; onchip anode; Anodes; Atomic beams; Cathodes; Conductivity; Copper; Electrodes; Fabrication; Integrated circuit interconnections; Lithography; Monitoring;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.843149
Filename :
843149
Link To Document :
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