DocumentCode
1338398
Title
Nanometer-scale copper electrodeposition from an on-chip source
Author
Wu, Mingshaw W. ; Sohn, Lydia L.
Author_Institution
Dept. of Phys., Princeton Univ., NJ, USA
Volume
21
Issue
6
fYear
2000
fDate
6/1/2000 12:00:00 AM
Firstpage
277
Lastpage
279
Abstract
Using both an on-chip anode as a source of copper and a copper-free, acidic electroplating solution, we have fabricated electrodes with separations on the order of 10 nm or less. During the electrodeposition process, we observe steplike increases in conductance, corresponding to atomic rearrangement. These conductance steps indicate that the separation between the electrodes is on the atomic length scale. Applications of this technique include the fabrication of electrodes with nanometer separations and the repair of both malformed bus lines and damaged masks.
Keywords
copper; electrochemical electrodes; electrodeposition; integrated circuit interconnections; metallisation; microelectrodes; nanotechnology; 10 nm; Cu; Cu-free acidic electroplating solution; damaged mask repair; electrode fabrication; malformed bus line repair; nanometer separations; nanometer-scale Cu electrodeposition; onchip Cu source; onchip anode; Anodes; Atomic beams; Cathodes; Conductivity; Copper; Electrodes; Fabrication; Integrated circuit interconnections; Lithography; Monitoring;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/55.843149
Filename
843149
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