• DocumentCode
    1338398
  • Title

    Nanometer-scale copper electrodeposition from an on-chip source

  • Author

    Wu, Mingshaw W. ; Sohn, Lydia L.

  • Author_Institution
    Dept. of Phys., Princeton Univ., NJ, USA
  • Volume
    21
  • Issue
    6
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    277
  • Lastpage
    279
  • Abstract
    Using both an on-chip anode as a source of copper and a copper-free, acidic electroplating solution, we have fabricated electrodes with separations on the order of 10 nm or less. During the electrodeposition process, we observe steplike increases in conductance, corresponding to atomic rearrangement. These conductance steps indicate that the separation between the electrodes is on the atomic length scale. Applications of this technique include the fabrication of electrodes with nanometer separations and the repair of both malformed bus lines and damaged masks.
  • Keywords
    copper; electrochemical electrodes; electrodeposition; integrated circuit interconnections; metallisation; microelectrodes; nanotechnology; 10 nm; Cu; Cu-free acidic electroplating solution; damaged mask repair; electrode fabrication; malformed bus line repair; nanometer separations; nanometer-scale Cu electrodeposition; onchip Cu source; onchip anode; Anodes; Atomic beams; Cathodes; Conductivity; Copper; Electrodes; Fabrication; Integrated circuit interconnections; Lithography; Monitoring;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.843149
  • Filename
    843149