• DocumentCode
    1338590
  • Title

    Evaluating fault trees (AND and OR gates only) with repeated events

  • Author

    Brown, Kevin S.

  • Volume
    39
  • Issue
    2
  • fYear
    1990
  • fDate
    6/1/1990 12:00:00 AM
  • Firstpage
    226
  • Lastpage
    235
  • Abstract
    It is pointed out that a common practice in the evaluation of large fault trees is to truncate the computation by neglecting high-order or low-probability cutsets. A major disadvantage of most simple truncation methods, however, is that their accuracy is indeterminate because they do not establish rigorous bounds on the combined probability of the neglected cutsets. A truncated with residuals algorithm is presented. It uses probability-based truncation and determines a rigorous upper bound on each event-probability by propagating the effect of all the truncated cutsets in the form of numeric residuals. The method applies only to fault trees constructed entirely of AND and OR gates and allows unrestricted use of repeated events
  • Keywords
    failure analysis; logic gates; probability; reliability theory; AND gates; OR gates; cutsets; fault tree evaluation; numeric residuals; probability-based truncation; reliability; repeated events; rigorous upper bound; truncated with residuals algorithm; Books; Fault trees; Sorting; Upper bound;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.55886
  • Filename
    55886