DocumentCode
1338590
Title
Evaluating fault trees (AND and OR gates only) with repeated events
Author
Brown, Kevin S.
Volume
39
Issue
2
fYear
1990
fDate
6/1/1990 12:00:00 AM
Firstpage
226
Lastpage
235
Abstract
It is pointed out that a common practice in the evaluation of large fault trees is to truncate the computation by neglecting high-order or low-probability cutsets. A major disadvantage of most simple truncation methods, however, is that their accuracy is indeterminate because they do not establish rigorous bounds on the combined probability of the neglected cutsets. A truncated with residuals algorithm is presented. It uses probability-based truncation and determines a rigorous upper bound on each event-probability by propagating the effect of all the truncated cutsets in the form of numeric residuals. The method applies only to fault trees constructed entirely of AND and OR gates and allows unrestricted use of repeated events
Keywords
failure analysis; logic gates; probability; reliability theory; AND gates; OR gates; cutsets; fault tree evaluation; numeric residuals; probability-based truncation; reliability; repeated events; rigorous upper bound; truncated with residuals algorithm; Books; Fault trees; Sorting; Upper bound;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.55886
Filename
55886
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