• DocumentCode
    1338690
  • Title

    Measurement of the Force on Microparticles in an Energetic Ion Beam

  • Author

    Trottenberg, Thomas ; Schneider, Viktor ; Kersten, Holger

  • Author_Institution
    Inst. of Exp. & Appl. Phys., Christian-Albrechts-Univ., Kiel, Germany
  • Volume
    38
  • Issue
    4
  • fYear
    2010
  • fDate
    4/1/2010 12:00:00 AM
  • Firstpage
    774
  • Lastpage
    780
  • Abstract
    Forces on microparticles in energetic ion beams are investigated experimentally. For this purpose, hollow glass microspheres are injected into a vertically upward directed beam. The particles are illuminated by a diode laser, and their scattered light is recorded with a charge-coupled device camera. From the trajectories, the acceleration and net force on the particles are determined. It is found that the force is significantly higher than the expected ion drag force. This additional part of the total force is explained with fast neutral atoms produced by charge-exchange collisions. Special attention is paid to the momentum contribution from sputtered atoms, which is shown to be negligible in this experiment.
  • Keywords
    dusty plasmas; ion beams; plasma diagnostics; plasma transport processes; plasma-beam interactions; charge-coupled device camera; charge-exchange collisions; diode laser; energetic ion beam; fast neutral atoms; force measurement; hollow glass microspheres; ion drag force; microparticles; particle acceleration; particle trajectories; scattered light; Complex plasmas; dusty plasmas; ion beams; ion drag; microparticles; particle beam interactions in plasmas; particle charging; particle collisions; particle tracking;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2009.2034857
  • Filename
    5339186