DocumentCode
1338918
Title
A Flexible Approach to Improving System Reliability with Virtual Lockstep
Author
Jeffery, Casey M. ; Figueiredo, Renato J O
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA
Volume
9
Issue
1
fYear
2012
Firstpage
2
Lastpage
15
Abstract
There is an increasing need for fault tolerance capabilities in logic devices brought about by the scaling of transistors to ever smaller geometries. This paper presents a hypervisor-based replication approach that can be applied to commodity hardware to allow for virtually lockstepped execution. It offers many of the benefits of hardware-based lockstep while being cheaper and easier to implement and more flexible in the configurations supported. A novel form of processor state fingerprinting is also presented, which can significantly reduce the fault detection latency. This further improves reliability by triggering rollback recovery before errors are recorded to a checkpoint. The mechanisms are validated using a full prototype and the benchmarks considered indicate an average performance overhead of approximately 14 percent with the possibility for significant optimization. Finally, a unique method of using virtual lockstep for fault injection testing is presented and used to show that significant detection latency reduction is achievable by comparing only a small amount of data across replicas.
Keywords
electronic engineering computing; fault diagnosis; fault tolerance; integrated circuit reliability; logic circuits; optimisation; transistors; detection latency reduction; fault detection latency; fault injection testing; fault tolerance capabilities; hypervisor based replication approach; logic devices; optimization; processor state fingerprinting; rollback recovery; system reliability; transistors scaling; virtually lockstepped execution; Fault detection; Fingerprint recognition; Hardware; Prototypes; Reliability engineering; Virtualization; autonomic computing.; dependable architectures; fault injection; software reliability;
fLanguage
English
Journal_Title
Dependable and Secure Computing, IEEE Transactions on
Publisher
ieee
ISSN
1545-5971
Type
jour
DOI
10.1109/TDSC.2010.53
Filename
5590258
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