Electro-optic near-field mapping of planar resonators

Author

Pfeifer, Torsten ; Loffler, Torsten ; Roskos, Hartmut G. ; Kurz, Heinrich ; Singer, Markus ; Biebl, Erwin M.

Author_Institution

Inst. fur Halbleitertech. II, Tech. Hochschule Aachen, Germany

Volume

46

Issue

2

fYear

1998

fDate

2/1/1998 12:00:00 AM

Firstpage

284

Lastpage

291

Abstract

A comprehensive experimental and theoretical study for the determination of the electric near-field above planar resonators is presented. The transverse component of the electric field is mapped by external electro-optic (EO) sampling technique with high spatial and temporal resolution. The evolution of the near-field radiation pattern of the investigated 7-GHz planar resonator to the onset of the far-field pattern is traced by measurements at various heights above the sample. Frequency-dependent measurements allow to characterize the field pattern changes when the frequency is swept through the main resonance. Additional undesired resonances are identified by the detected mode pattern. The experimental data are reproduced by simulations based upon an electric field integral equation (EFIE) method

Keywords

antenna radiation patterns; electric field measurement; electro-optical devices; integral equations; measurement by laser beam; millimetre wave antennas; resonators; 7 GHz; detected mode pattern; electric field; electric field integral equation method; electric near-field; electro-optic near-field mapping; external electro-optic sampling technique; frequency-dependent measurements; near-field radiation pattern; planar resonators; resonances; simulations; transverse component; Circuits; Frequency; Millimeter wave technology; Optical resonators; Optical transmitters; Oscillators; Resonance; Sampling methods; Spatial resolution; Ultrafast optics;

fLanguage

English

Journal_Title

Antennas and Propagation, IEEE Transactions on

Publisher

ieee

ISSN

0018-926X

Type

jour

DOI

10.1109/8.660974

Filename

660974