Title :
Using Zernike moments for the illumination and geometry invariant classification of multispectral texture
Author :
Wang, Lizhi ; Healey, Glenn
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
fDate :
2/1/1998 12:00:00 AM
Abstract :
We develop a method for recognizing color texture independent of rotation, scale, and illumination. Color texture is modeled using spatial correlation functions defined within and between sensor bands. Using a linear model for surface spectral reflectance with the same number of parameters as the number of sensor classes, we show that illumination and geometry changes in the scene correspond to a linear transformation of the correlation functions and a linear transformation of their coordinates. A several step algorithm that includes scale estimation and correlation moment computation is used to achieve the invariance. The key to the method is the new result that illumination, rotation, and scale changes in the scene correspond to a specific transformation of correlation function Zernike moment matrices. These matrices can be estimated from a color image. This relationship is used to derive an efficient algorithm for recognition. The algorithm is substantiated using classification results on over 200 images of color textures obtained under various illumination conditions and geometric configurations
Keywords :
correlation methods; image classification; image colour analysis; image texture; matrix algebra; spectral analysis; Zernike moment matrices; algorithm; color texture recognition; correlation functions; correlation moment computation; geometric configurations; geometry invariant classification; illumination conditions; illumination invariant classification; image classification; linear model; linear transformation; multispectral texture; rotation; scale changes; scale estimation; sensor bands; sensor classes; spatial correlation functions; surface spectral reflectance; Color; Geometry; Image recognition; Indexing; Layout; Lighting; Parameter estimation; Reflectivity; Solid modeling; Tellurium;
Journal_Title :
Image Processing, IEEE Transactions on