Correlation of Dynamic Parameter Modification and ASET Sensitivity in a Shunt Voltage Reference

Author

Roche, Nicolas J -H ; Buchner, Stephen P. ; Dusseau, Laurent ; Kruckmeyer, Kurby ; Boch, Jérome ; Warner, Jeffrey H. ; Saigné, Frédéric ; McMorrow, Dale ; Auriel, Gérard ; Azaïs, Bruno

Author_Institution

IES, Univ. Montpellier 2, Montpellier, France

Volume

59

Issue

6

fYear

2012

Firstpage

2756

Lastpage

2763

Abstract

Analog Single Event Transients (ASETs) in two different shunt voltage references used in power management systems are investigated. Little has been published regarding how the dynamic parameter changes induced by external circuit design, such as time constant, damping coefficient or natural frequency affect ASET shapes. Modifications of the dynamic parameters of the circuit are measured by step response measurement. A correlation between dynamic parameters and ASET laser testing results is proposed. This study establishes the correlation between the dynamic parameters of a shunt voltage reference and ASET parameters such as pulse duration, and positive and negative amplitude.

Keywords

bipolar analogue integrated circuits; integrated circuit design; integrated circuit measurement; nuclear electronics; power system transients; step response; ASET laser testing results; ASET sensitivity; analog single event transients; damping coefficient; dynamic parameter modification correlation; external circuit design; natural frequency; power management systems; pulse duration; shunt voltage reference; step response measurement; time constant; Bipolar integrated circuits; Single event transient; Transient analysis; Transient response; Bipolar circuits; bipolar devices; single event effects; single event modeling; single event transients; transient analysis; transient propagation; transient response; trigger systems;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2012.2224127

Filename

6361442