DocumentCode :
1339959
Title :
Error performance of MPSK trellis-coded modulation over nonindependent Rician fading channels
Author :
Tellambura, C. ; Bhargava, Vijay K.
Author_Institution :
Dept. of Digital Syst., Monash Univ., Clayton, Vic., Australia
Volume :
47
Issue :
1
fYear :
1998
fDate :
2/1/1998 12:00:00 AM
Firstpage :
152
Lastpage :
162
Abstract :
This paper presents new upper bounds on the pairwise error probability (PEP) of trellis-coded modulation (TCM) schemes over nonindependent Rician fading channels. Cases considered are coherent and pilot-tone-aided detection and differential detection of trellis-coded multilevel phase-shift keying (TC-MPSK) systems. The average bit-error probability Pb can be approximated by truncating the union bound. This method does not necessarily lead to an upper bound on Pb, and, hence, the approximation must be used with simulation results. In addition, for Rayleigh fading channels with an exponential autocovariance function, bounds resembling those for memoryless channels have been derived. The bounds are substantially more accurate than Chernoff bounds and hence allow for accurate estimation of system performance when the assumption of ideal interleaving is relaxed
Keywords :
Rayleigh channels; Rician channels; approximation theory; covariance analysis; error statistics; fading; land mobile radio; phase shift keying; trellis coded modulation; MPSK trellis-coded modulation; Rayleigh fading channels; TC-MPSK; bit-error probability; coherent detection; differential detection; error performance; exponential autocovariance function; interleaving; nonindependent Rician fading channels; pairwise error probability; pilot-tone-aided detection; system performance; trellis-coded multilevel phase-shift keying; union bound; Computer simulation; Decoding; Fading; Interleaved codes; Pairwise error probability; Phase detection; Phase shift keying; Rayleigh channels; Rician channels; Upper bound;
fLanguage :
English
Journal_Title :
Vehicular Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9545
Type :
jour
DOI :
10.1109/25.661042
Filename :
661042
Link To Document :
بازگشت