• DocumentCode
    1340298
  • Title

    Measuring jitter and phase error in microprocessor phase-locked loops

  • Author

    Jenkins, Keith A. ; Eckhardt, James P.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    17
  • Issue
    2
  • fYear
    2000
  • Firstpage
    86
  • Lastpage
    93
  • Abstract
    The use of phase-locked loops (PLLs) for clock generation in modern microprocessors has been proliferating in recent years. This is because PLLs have the advantages of allowing multiplication of the reference clock frequency and allowing phase alignment between chips. The PLL locks to a reference clock but can generate output clocks that are a multiple of the reference. It is argued that excessive “jitter”, caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured-not just the jitter
  • Keywords
    digital phase locked loops; jitter; microprocessor chips; accumulated phase error; clock generation; jitter; microprocessor phase-locked loops; multichip system; phase error; Circuit noise; Clocks; Jitter; Microprocessors; Oscilloscopes; Phase locked loops; Phase measurement; Phase noise; Semiconductor device measurement; Working environment noise;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.844337
  • Filename
    844337