DocumentCode
1340298
Title
Measuring jitter and phase error in microprocessor phase-locked loops
Author
Jenkins, Keith A. ; Eckhardt, James P.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
17
Issue
2
fYear
2000
Firstpage
86
Lastpage
93
Abstract
The use of phase-locked loops (PLLs) for clock generation in modern microprocessors has been proliferating in recent years. This is because PLLs have the advantages of allowing multiplication of the reference clock frequency and allowing phase alignment between chips. The PLL locks to a reference clock but can generate output clocks that are a multiple of the reference. It is argued that excessive “jitter”, caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured-not just the jitter
Keywords
digital phase locked loops; jitter; microprocessor chips; accumulated phase error; clock generation; jitter; microprocessor phase-locked loops; multichip system; phase error; Circuit noise; Clocks; Jitter; Microprocessors; Oscilloscopes; Phase locked loops; Phase measurement; Phase noise; Semiconductor device measurement; Working environment noise;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.844337
Filename
844337
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