• DocumentCode
    1340735
  • Title

    Combined optical and electric simulation of metal-semiconductor-metal photodetectors

  • Author

    Körner, T.O.

  • Author_Institution
    ISE Integrated Syst. Eng. AG, Zurich, Switzerland
  • Volume
    147
  • Issue
    2
  • fYear
    2000
  • fDate
    4/1/2000 12:00:00 AM
  • Firstpage
    89
  • Lastpage
    95
  • Abstract
    The combined optical and electric simulation of a metal-semiconductor-metal (MSM) photodetector is presented. The generalised multipole technique (GMT) for rigorous modelling of the light propagation is combined with electric device simulation methods based on a drift-diffusion charge carrier transport model. Different optical designs are compared with respect to the detector performance that can be achieved. It is demonstrated that the use of incoupling gratings can significantly increase the detector efficiency, compared to designs using antireflective layers. Numerical experiments carried out for illumination under varying angles of incidence also show that not only the amount of light that reaches the semiconducting substrate but also the exact spatial intensity distribution have non-negligible effects on the detector efficiency and response times. This in turn proves the necessity of rigorous optical simulation
  • Keywords
    carrier mobility; diffraction gratings; light propagation; metal-semiconductor-metal structures; optical design techniques; photodetectors; semiconductor device models; MSM photodetectors; antireflective layers; combined optical/electric simulation; detector efficiency; detector performance; drift-diffusion charge carrier transport model; electric device simulation methods; exact spatial intensity distribution; generalised multipole technique; incoupling gratings; light propagation; metal-semiconductor-metal photodetectors; optical designs; response times; rigorous modelling; rigorous optical simulation; semiconducting substrate; varying angles of incidence;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2433
  • Type

    jour

  • DOI
    10.1049/ip-opt:20000293
  • Filename
    844441