DocumentCode :
1340870
Title :
High-transconductance delta-doped InAs/AlSb HFETs with ultrathin silicon-doped InAs quantum well donor layer
Author :
Bolognesi, C.R. ; Dvorak, M.W. ; Chow, D.H.
Author_Institution :
Dept. of Phys., Simon Fraser Univ., Burnaby, BC, Canada
Volume :
19
Issue :
3
fYear :
1998
fDate :
3/1/1998 12:00:00 AM
Firstpage :
83
Lastpage :
85
Abstract :
Modulation-doping of InAs/AlSb quantum wells generally requires the use of chalcogenide donor impurities because silicon, the usual donor of choice in MBE, displays an amphoteric behavior in antimonide compounds. We demonstrate the use of an ultrathin 9 /spl Aring/ silicon doped InAs well to delta-dope the current-carrying InAs channel of an InAs/AlSb heterostructure field-effect transistor (HFET). Using this new approach, we have fabricated delta-doped 0.6-μm gate InAs/AlSb HFETs with a measured extrinsic transconductance of 800 mS/mm at V/sub DS/=0.8 V, a cutoff frequency fT=60 GHz (Fmax=87 GHz), and well-behaved I-V curves. HFET´s with a 2-μm gatelength also feature very high transconductances in the 700-800 mS/mm range at V/sub DS/=1.5 V. The present work eliminates the requirement for chalcogenide compound donor sources to delta-dope InAs/AlSb quantum wells by allowing the use of silicon in the fabrication of high-performance InAs/AlSb HFET´s.
Keywords :
III-V semiconductors; aluminium compounds; high electron mobility transistors; indium compounds; semiconductor doping; semiconductor quantum wells; silicon; 0.6 micron; 0.8 V; 1.5 V; 2 micron; 60 GHz; 9 angstrom; I-V curves; InAs:Si-AlSb; current-carrying channel; cutoff frequency; delta-doped HFETs; extrinsic transconductance; quantum well donor layer; Cutoff frequency; Displays; Epitaxial layers; Fabrication; Frequency measurement; HEMTs; Impurities; MODFETs; Silicon; Transconductance;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.661172
Filename :
661172
Link To Document :
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