• DocumentCode
    1341188
  • Title

    A stochastic wire-length distribution for gigascale integration (GSI). I. Derivation and validation

  • Author

    Davis, Jeffrey A. ; De, Vivek K. ; Meindl, James D.

  • Author_Institution
    Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    45
  • Issue
    3
  • fYear
    1998
  • fDate
    3/1/1998 12:00:00 AM
  • Firstpage
    580
  • Lastpage
    589
  • Abstract
    Based on Rent´s Rule, a well-established empirical relationship, a rigorous derivation of a complete wire-length distribution for on-chip random logic networks is performed. This distribution is compared to actual wire-length distributions for modern microprocessors, and a methodology to calculate the wire-length distribution for future gigascale integration (GSI) products is proposed
  • Keywords
    integrated circuit interconnections; integrated circuit modelling; integrated logic circuits; microprocessor chips; stochastic processes; GSI; Rent´s Rule; gigascale integration; microprocessor; on-chip random logic network; stochastic wire length distribution; Density functional theory; Logic arrays; Microprocessors; Network-on-a-chip; Pins; Power system interconnection; Power system modeling; Stochastic processes; Stochastic systems; Wiring;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.661219
  • Filename
    661219