Title :
Minimizing Photodiode Nonlinearities by Compensating Voltage-Dependent Responsivity Effects
Author :
Hastings, Alexander S. ; Tulchinsky, David A. ; Williams, Keith J. ; Pan, Huapu ; Beling, Andreas ; Campbell, Joe C.
Author_Institution :
Photonics Technol. Branch, Naval Res. Lab., Washington, DC, USA
Abstract :
Two voltage-dependant responsivity effects, impact ionization and Franz-Keldysh oscillations, are shown to have opposing effects at certain wavelengths in p-i-n photodiodes. It is shown that these two effects can compensate each other and minimize photodiode nonlinearities when optimized with respect to wavelength and bias voltage.
Keywords :
impact ionisation; oscillations; p-i-n photodiodes; Franz-Keldysh oscillations; impact ionization; p-i-n photodiodes; photodiode nonlinearity; voltage-dependent responsivity effects; Distortion measurement; Impact ionization; Optical distortion; Optical variables measurement; Photodiodes; Voltage measurement; Wavelength measurement; Distortion; nonlinearities; p-i-n photodiodes;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2010.2081968
