Title :
Ultra-Low Emissivity Alpha-Particle Detection
Author :
Gordon, Michael S. ; Rodbell, Kenneth P. ; Tang, HenryH K. ; Ronsheim, Paul ; Zhu, Zhengmao ; Rauch, Stewart E. ; McNally, Brendan D. ; Coleman, Stuart
Author_Institution :
IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
New alpha counters make accurate measurements of low emissivity samples possible. Modeling results set lower limits for measurements at sea level of silicon substrates to about 0.3 α/khr-cm2. Our measurements demonstrate the effect of cosmic ray shielding on the measured alpha-particle emissivity. A few atoms of radon contamination can cause elevated emissivities many days after exposure.
Keywords :
alpha-particle detection; emissivity; ionisation chambers; radon; alpha counters; alpha-particle emissivity; cosmic ray shielding; elevated emissivities; low emissivity samples; radon contamination; silicon substrates; ultra-low emissivity alpha-particle detection; Alpha particles; Ionizing radiation detectors; Radiation effects; Alpha particles; energy spectra; ionization detectors; low-background; radon; terrestrial neutrons;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2012.2223234
