• DocumentCode
    1341325
  • Title

    Ultra-Low Emissivity Alpha-Particle Detection

  • Author

    Gordon, Michael S. ; Rodbell, Kenneth P. ; Tang, HenryH K. ; Ronsheim, Paul ; Zhu, Zhengmao ; Rauch, Stewart E. ; McNally, Brendan D. ; Coleman, Stuart

  • Author_Institution
    IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    59
  • Issue
    6
  • fYear
    2012
  • Firstpage
    3101
  • Lastpage
    3109
  • Abstract
    New alpha counters make accurate measurements of low emissivity samples possible. Modeling results set lower limits for measurements at sea level of silicon substrates to about 0.3 α/khr-cm2. Our measurements demonstrate the effect of cosmic ray shielding on the measured alpha-particle emissivity. A few atoms of radon contamination can cause elevated emissivities many days after exposure.
  • Keywords
    alpha-particle detection; emissivity; ionisation chambers; radon; alpha counters; alpha-particle emissivity; cosmic ray shielding; elevated emissivities; low emissivity samples; radon contamination; silicon substrates; ultra-low emissivity alpha-particle detection; Alpha particles; Ionizing radiation detectors; Radiation effects; Alpha particles; energy spectra; ionization detectors; low-background; radon; terrestrial neutrons;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2012.2223234
  • Filename
    6365397
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1341325