Title :
Photonic Chip-Based Simultaneous Multi-Impairment Monitoring for Phase-Modulated Optical Signals
Author :
Vo, Trung D. ; Schröder, Jochen ; Pelusi, Mark D. ; Madden, Stephen J. ; Choi, Duk-Yong ; Bulla, Douglas A P ; Luther-Davies, Barry ; Eggleton, Benjamin J.
Author_Institution :
Centre for Ultrahigh Bandwidth Devices for Opt. Syst., Univ. of Sydney, Sydney, NSW, Australia
Abstract :
We report the first experimental demonstration of simultaneous multi-impairment monitoring of phase-modulated 40 Gbit/s nonreturn to zero differential phase-shift keying (NRZ-DPSK) and 640 Gbit/s return-to-zero (RZ)-DPSK optical signals. Our approach exploits the femtosecond response time of the Kerr nonlinearity in a centimeter-scale, highly nonlinear, dispersion engineered chalcogenide planar waveguide to perform THz bandwidth RF spectrum analysis. The features observed on the radio-frequency (RF) spectrum are directly utilized to perform simultaneous group velocity dispersion and in-band optical signal-to-noise ratio (SNR) monitoring. We also numerically investigate the measurement accuracy of this monitoring technique, highlighting the advantages, and suitability of the chalcogenide rib waveguide.
Keywords :
differential phase shift keying; microwave photonics; optical Kerr effect; optical communication equipment; optical dispersion; optical information processing; optical modulation; optical planar waveguides; spectral analysers; spectral analysis; Kerr nonlinearity; THz bandwidth RF spectrum analysis; femtosecond response time; group velocity dispersion monitoring; highly nonlinear dispersion engineered chalcogenide planar waveguide; in-band optical signal-to-noise ratio monitoring; multiimpairment monitoring; nonreturn-to-zero differential phase-shift keying; phase-modulated optical signals; photonic chip; return-to-zero differential phase-shift keying; Fiber nonlinear optics; Monitoring; Optical fibers; Optical noise; Radio frequency; Nonlinear optics; optical performance monitoring (OPM); optical planar waveguides; optical signal processing; spectrum analysis;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2010.2083635
