• DocumentCode
    1341349
  • Title

    An 8–16 GHz SiGe Low Noise Amplifier With Performance Tuning Capability for Mitigation of Radiation-Induced Performance Loss

  • Author

    Howard, Duane C. ; Saha, Prabir K. ; Shankar, Subramaniam ; Diestelhorst, Ryan M. ; England, Troy D. ; Lourenco, Nelson E. ; Kenyon, Eleazar ; Cressler, John D.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., N.W. Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    59
  • Issue
    6
  • fYear
    2012
  • Firstpage
    2837
  • Lastpage
    2846
  • Abstract
    We present a wideband, low noise amplifier (LNA) implemented in a Silicon-Germanium Heterojunction Bipolar Transistor (SiGe HBT) technology. This SiGe LNA covers a frequency range of 8-16 GHz and achieves a peak gain of 17.5 dB at nominal bias and a peak OIP3 of 15.8 dBm at 10 GHz at nominal bias. The noise figure (NF) of the LNA is 4.5-8.1 dB across band, and it nominally consumes 4 mA from a 4 V supply. Samples were irradiated with 63.3 MeV protons to proton-equivalent doses ranging from 200 krad(Si) to 2 Mrad(Si). This LNA incorporates bias control “tuning-knobs” to enable bias tuning to mitigate for RF performance loss due to total dose exposure and process variation in performance metrics. The effectiveness of the tuning “knobs” to compensate for lost post-irradiated performance was investigated. It was found that the LNA performance can be restored with the use of the tuning knobs with a performance tuning algorithm.
  • Keywords
    Ge-Si alloys; dosimetry; heterojunction bipolar transistors; low noise amplifiers; microwave amplifiers; microwave transistors; radiation hardening (electronics); tuning; wideband amplifiers; LNA performance; RF performance loss; SiGe; SiGe low noise amplifier; bias control tuning-knob; bias tuning; dose exposure; frequency 8 GHz to 16 GHz; noise ήgure; noise figure 4.5 dB to 8.1 dB; nominal bias; peak OIP3; peak gain; performance metrics; performance tuning capability; postirradiated performance; process variation; proton-equivalent doses; radiation-induced performance loss mitigation; silicon-germanium heterojunction bipolar transistor technology; tuning algorithm; tuning knob; BiCMOS integrated circuits; Built-in self-test; Low-noise amplifiers; Silicon germanium; Wideband; BIST; BiCMOS; LNA; SiGe; built-in testing; total ionizing dose; wideband;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2012.2224132
  • Filename
    6365401