Title : 
Anomaly Detection of Polymer Resettable Circuit Protection Devices
         
        
            Author : 
Cheng, Shunfeng ; Tom, Kwok ; Pecht, Michael
         
        
            Author_Institution : 
Center for Adv. Life Cycle Eng., Univ. of Maryland, College Park, MD, USA
         
        
        
        
        
            fDate : 
6/1/2012 12:00:00 AM
         
        
        
        
            Abstract : 
As circuit protection devices, failure or abnormal behavior of polymer positive-temperature-coefficient resettable devices can cause damage to circuits. It is necessary to detect anomalies in the resettable circuit protection devices to provide early warning of failure and avoid damage to a circuit. In this paper, a novel anomaly detection method, the cross-validation-based sequential probability ratio test, is developed and applied to the failure precursor parameters of the resettable circuit protection devices to conduct anomaly detection. The cross-validation-based sequential probability ratio test integrates the advantages of both the sequential probability ratio test for in situ anomaly detection and the cross-validation technique for model parameter selection to reduce the probability of false and missed alarms in anomaly detection. The cross-validation-based sequential probability ratio test solves the model parameter selection difficulty of the traditional sequential probability ratio test and improves its performance in anomaly detection.
         
        
            Keywords : 
polymers; protection; statistical testing; cross-validation-based sequential probability ratio test; damage avoidance; failure precursor parameters; false probability reduction; in situ anomaly detection; polymer positive-temperature-coefficient resettable devices; polymer resettable circuit protection device anomaly detection; sequential probability ratio test; Indexes; Monitoring; Probability; Resistance; Temperature measurement; Temperature sensors; Training data; Anomaly detection; cross-validation-based sequential probability ratio test; failure precursor parameter; polymer positive-temperature-coefficient (PPTC) resettable circuit protection device; power supply protection;
         
        
        
            Journal_Title : 
Device and Materials Reliability, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TDMR.2011.2170689