DocumentCode
1341382
Title
Anomaly Detection of Polymer Resettable Circuit Protection Devices
Author
Cheng, Shunfeng ; Tom, Kwok ; Pecht, Michael
Author_Institution
Center for Adv. Life Cycle Eng., Univ. of Maryland, College Park, MD, USA
Volume
12
Issue
2
fYear
2012
fDate
6/1/2012 12:00:00 AM
Firstpage
420
Lastpage
427
Abstract
As circuit protection devices, failure or abnormal behavior of polymer positive-temperature-coefficient resettable devices can cause damage to circuits. It is necessary to detect anomalies in the resettable circuit protection devices to provide early warning of failure and avoid damage to a circuit. In this paper, a novel anomaly detection method, the cross-validation-based sequential probability ratio test, is developed and applied to the failure precursor parameters of the resettable circuit protection devices to conduct anomaly detection. The cross-validation-based sequential probability ratio test integrates the advantages of both the sequential probability ratio test for in situ anomaly detection and the cross-validation technique for model parameter selection to reduce the probability of false and missed alarms in anomaly detection. The cross-validation-based sequential probability ratio test solves the model parameter selection difficulty of the traditional sequential probability ratio test and improves its performance in anomaly detection.
Keywords
polymers; protection; statistical testing; cross-validation-based sequential probability ratio test; damage avoidance; failure precursor parameters; false probability reduction; in situ anomaly detection; polymer positive-temperature-coefficient resettable devices; polymer resettable circuit protection device anomaly detection; sequential probability ratio test; Indexes; Monitoring; Probability; Resistance; Temperature measurement; Temperature sensors; Training data; Anomaly detection; cross-validation-based sequential probability ratio test; failure precursor parameter; polymer positive-temperature-coefficient (PPTC) resettable circuit protection device; power supply protection;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2011.2170689
Filename
6035766
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