• DocumentCode
    1341382
  • Title

    Anomaly Detection of Polymer Resettable Circuit Protection Devices

  • Author

    Cheng, Shunfeng ; Tom, Kwok ; Pecht, Michael

  • Author_Institution
    Center for Adv. Life Cycle Eng., Univ. of Maryland, College Park, MD, USA
  • Volume
    12
  • Issue
    2
  • fYear
    2012
  • fDate
    6/1/2012 12:00:00 AM
  • Firstpage
    420
  • Lastpage
    427
  • Abstract
    As circuit protection devices, failure or abnormal behavior of polymer positive-temperature-coefficient resettable devices can cause damage to circuits. It is necessary to detect anomalies in the resettable circuit protection devices to provide early warning of failure and avoid damage to a circuit. In this paper, a novel anomaly detection method, the cross-validation-based sequential probability ratio test, is developed and applied to the failure precursor parameters of the resettable circuit protection devices to conduct anomaly detection. The cross-validation-based sequential probability ratio test integrates the advantages of both the sequential probability ratio test for in situ anomaly detection and the cross-validation technique for model parameter selection to reduce the probability of false and missed alarms in anomaly detection. The cross-validation-based sequential probability ratio test solves the model parameter selection difficulty of the traditional sequential probability ratio test and improves its performance in anomaly detection.
  • Keywords
    polymers; protection; statistical testing; cross-validation-based sequential probability ratio test; damage avoidance; failure precursor parameters; false probability reduction; in situ anomaly detection; polymer positive-temperature-coefficient resettable devices; polymer resettable circuit protection device anomaly detection; sequential probability ratio test; Indexes; Monitoring; Probability; Resistance; Temperature measurement; Temperature sensors; Training data; Anomaly detection; cross-validation-based sequential probability ratio test; failure precursor parameter; polymer positive-temperature-coefficient (PPTC) resettable circuit protection device; power supply protection;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2011.2170689
  • Filename
    6035766