DocumentCode :
1341444
Title :
A dynamically reconfigurable interconnect for array processors
Author :
John, Lizy Kurian ; John, Eugene
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Volume :
6
Issue :
1
fYear :
1998
fDate :
3/1/1998 12:00:00 AM
Firstpage :
150
Lastpage :
157
Abstract :
Reconfigurability of processor arrays is important due to two reasons (1) to efficiently execute different algorithms and (2) to isolate faulty processors. An array processor that is reconfigurable by the user any number of times to yield a different topology or to isolate faults is envisaged in this paper. The system has a host or controller that broadcasts a command to the interconnect to configure itself into a particular fashion. The interconnect uses static-RAM programming technology and can be programmed to different configurations by sending a different set of bits to the configuration random access memory (RAM) in the interconnect. We present three designs reconfigurable into array, ring, mesh, or Illiac mesh topologies. The first design provides no redundancy or fault tolerance. The second design is capable of graceful degradation by bypassing faulty elements. The third design is capable of graceful degradation by rerouting. The details of the interconnect and the configuration RAM contents for typical configurations are illustrated. It is seen that reconfigurable interconnect results in a highly reconfigurable or polymorphic computer.
Keywords :
VLSI; fault tolerant computing; integrated circuit interconnections; integrated circuit reliability; microprocessor chips; parallel architectures; random-access storage; reconfigurable architectures; redundancy; Illiac mesh topology; array processors; array topology; configuration RAM; configuration random access memory; dynamically reconfigurable interconnect; fault isolation; fault tolerance; mesh topology; polymorphic computer; redundancy; rerouting; ring topology; static-RAM programming technology; topology reconfiguration; Binary trees; Degradation; Fault tolerance; Isolation technology; Lattices; Network topology; Read-write memory; Reconfigurable architectures; Switches; Very large scale integration;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.661257
Filename :
661257
Link To Document :
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