DocumentCode
1341526
Title
A Model for Burn-In Programs for Components with Eliminateable Defects
Author
Dishon, Menachem ; Weiss, George H.
Author_Institution
Weizmann Institute of Science//Rehovot, Israel
Issue
4
fYear
1976
Firstpage
259
Lastpage
260
Abstract
We consider a component with a random number of defects which can be discovered and corrected during the course of a burn-in program. The failure rate after burn-in is constant (in time) and depends on the number of remaining defects. A sufficient condition is given for a burn-in program to lead to increased mean time to failure; it is given in terms of the prior distribution of the number of defects and the failure rates.
Keywords
Equations; Failure analysis; Reliability theory; Sufficient conditions; Time measurement; Burn-in; Reliability growth;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1976.5219987
Filename
5219987
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