• DocumentCode
    1341526
  • Title

    A Model for Burn-In Programs for Components with Eliminateable Defects

  • Author

    Dishon, Menachem ; Weiss, George H.

  • Author_Institution
    Weizmann Institute of Science//Rehovot, Israel
  • Issue
    4
  • fYear
    1976
  • Firstpage
    259
  • Lastpage
    260
  • Abstract
    We consider a component with a random number of defects which can be discovered and corrected during the course of a burn-in program. The failure rate after burn-in is constant (in time) and depends on the number of remaining defects. A sufficient condition is given for a burn-in program to lead to increased mean time to failure; it is given in terms of the prior distribution of the number of defects and the failure rates.
  • Keywords
    Equations; Failure analysis; Reliability theory; Sufficient conditions; Time measurement; Burn-in; Reliability growth;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1976.5219987
  • Filename
    5219987