DocumentCode :
1341526
Title :
A Model for Burn-In Programs for Components with Eliminateable Defects
Author :
Dishon, Menachem ; Weiss, George H.
Author_Institution :
Weizmann Institute of Science//Rehovot, Israel
Issue :
4
fYear :
1976
Firstpage :
259
Lastpage :
260
Abstract :
We consider a component with a random number of defects which can be discovered and corrected during the course of a burn-in program. The failure rate after burn-in is constant (in time) and depends on the number of remaining defects. A sufficient condition is given for a burn-in program to lead to increased mean time to failure; it is given in terms of the prior distribution of the number of defects and the failure rates.
Keywords :
Equations; Failure analysis; Reliability theory; Sufficient conditions; Time measurement; Burn-in; Reliability growth;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1976.5219987
Filename :
5219987
Link To Document :
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