Title :
A Model for Burn-In Programs for Components with Eliminateable Defects
Author :
Dishon, Menachem ; Weiss, George H.
Author_Institution :
Weizmann Institute of Science//Rehovot, Israel
Abstract :
We consider a component with a random number of defects which can be discovered and corrected during the course of a burn-in program. The failure rate after burn-in is constant (in time) and depends on the number of remaining defects. A sufficient condition is given for a burn-in program to lead to increased mean time to failure; it is given in terms of the prior distribution of the number of defects and the failure rates.
Keywords :
Equations; Failure analysis; Reliability theory; Sufficient conditions; Time measurement; Burn-in; Reliability growth;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1976.5219987