DocumentCode :
1341581
Title :
Noise-assisted data processing in measurement science: Part two
Author :
Yan, Ruqiang ; Zhao, Rui ; Gao, Robert X.
Author_Institution :
Instrum. Sci. & Technol., Southeast Univ., Nanjing, China
Volume :
15
Issue :
6
fYear :
2012
fDate :
12/1/2012 12:00:00 AM
Firstpage :
32
Lastpage :
35
Abstract :
In Part One of this tutorial [1], we introduced stochastic resonance-based data processing, where a weak signal can be amplified and detected by deliberately adding a small amount of noise to a nonlinear bistable or multi-stable system. In this part of the tutorial, we introduce another noise-assisted data processing technique, ensemble empirical mode decomposition (EEMD), which has attracted increasing attention in various science and engineering domains including measurement science.
Keywords :
data analysis; measurement systems; signal denoising; signal detection; singular value decomposition; stochastic processes; EEMD; ensemble empirical mode decomposition; measurement science; noise assisted data processing; nonlinear bistable system; nonlinear multistable system; signal amplification; signal detection; stochastic resonance-based data processing; Noise measurement; Process control; Resonance; Stochastic resonance; Tutorials; White noise;
fLanguage :
English
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2012.6365542
Filename :
6365542
Link To Document :
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