Title :
Cumulative Damage Processes and Alertness of the Worker
Author :
Ramanarayanan, R.
Author_Institution :
Dept. of Mathematics//Annamalai University//Annamalainagar 608 101 INDIA
Abstract :
A device which is exposed to the cumulative damage process due to the occurrence of shocks is considered. The life distribution of the device is obtained here. Damages occur to the device when the worker is not alert or the device is weak. Known results in counter theory are used to obtain results.
Keywords :
Art; Convolution; Counting circuits; Electric shock; Exponential distribution; Mathematical model; Reliability theory; Solid modeling; Alertness; Cumulative damage; Stable distribution; Threshold;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1976.5219997
