• DocumentCode
    1341603
  • Title

    A wafer-handling interface under processing ambient conditions for a single-wafer cluster tool

  • Author

    Kawamura, Yoshio ; Yamamoto, Tatsuharu ; Yokoyama, Natsuki ; Kawamoto, Yoshifumi

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • Volume
    11
  • Issue
    1
  • fYear
    1998
  • fDate
    2/1/1998 12:00:00 AM
  • Firstpage
    13
  • Lastpage
    19
  • Abstract
    The pretreatment process used in semiconductor manufacturing can include over one-hundred processes, and about 90% of the wafer transfers are done between processors or process chambers that have different ambient conditions from each other; that is, between the atmosphere and a vacuum ambient or between a low and a high vacuum ambient. The throughput and yield from a semiconductor manufacturing line can be greatly improved by reducing the pumping and setting time of each process chamber ambient that is needed when transferring a wafer. We previously proposed a wafer-handling interface that operates under processing ambient conditions (the WHIPAC), with which the processing ambient conditions in the process chamber need not be changed for every wafer exchange and processing ambient fluctuations can be made smaller. We have developed a WHIPAC that allows the wafer in a process chamber under processing ambient conditions to be exchanged with a small mobile buffer chamber located in the transfer chamber at the center of a cluster tool used for single-wafer processing. This paper describes the principle of the WHIPAC for a single-wafer cluster tool and discusses the experimental results obtained from tests of a prototype system
  • Keywords
    cluster tools; semiconductor device manufacture; WHIPAC; mobile buffer chamber; pretreatment; processing ambient; pumping time; semiconductor manufacturing; setting time; single-wafer cluster tool; throughput; vacuum ambient; wafer-handling interface; yield; Atmosphere; Contamination; Etching; Fluctuations; Manufacturing processes; Robots; Semiconductor device manufacture; System testing; Throughput; Ultra large scale integration;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/66.661279
  • Filename
    661279