• DocumentCode
    1341684
  • Title

    Design and Layout Effects on SET Propagation in 90-nm ASIC and FPGA Test Structures

  • Author

    Rezgui, Sana ; McCollum, John ; Won, Raymond

  • Author_Institution
    Actel Corp., Mountain View, CA, USA
  • Volume
    57
  • Issue
    6
  • fYear
    2010
  • Firstpage
    3716
  • Lastpage
    3724
  • Abstract
    SET propagations in ASIC-like and FPGA-like digital circuits are investigated, using 90-nm test structures, by fault injection and radiation tests. SET fault injection tests are used to show the dependence of the final SET-pulse on the design and layout of the logic circuit.
  • Keywords
    CMOS logic circuits; application specific integrated circuits; field programmable gate arrays; integrated circuit testing; ASIC test structure; ASIC-like digital circuit; FPGA test structure; FPGA-like digital circuit; SET propagation; fault injection test; logic circuit design; logic circuit layout; radiation test; Application specific integrated circuits; Field programmable gate arrays; Logic circuits; MOS devices; Fault injection; SET characterization; propagation and mitigation; radiation tests; reprogrammable and non-volatile flash-based FPGAs;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2010.2060496
  • Filename
    5593909
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1341684