Title :
Foreword for the Special Issue on ESD Technology
Author :
Boselli, G. ; Ker, Ming-Dou ; Duvvury, Charvaka
Author_Institution :
Analog ESD Group Manager, Texas Instruments Incorporated, Dallas, TX, USA
Abstract :
The four invited papers in this special issue focus on ESD technology. The first three are revised papers that were presented at the 2011 EOS/ESD Symposium, while the final ESD paper is an invited review paper to describe ESD protect design issues in state-of-the-art high voltage devices.
Keywords :
Electrostatic discharges; Meetings; Special issues and sections;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2012.2225232
