DocumentCode :
1341988
Title :
Optimal Selection of Sequential Tests for Reliability
Author :
Mogg, J.M.
Author_Institution :
College of Business Administration; University of Houston; Houston, TX 77004 USA
Issue :
2
fYear :
1977
fDate :
6/1/1977 12:00:00 AM
Firstpage :
116
Lastpage :
118
Abstract :
Reliability test requirements exist whereby truncated sequential test methods offer management the opportunity to minimize the s-expected cost of a test by optimal selection of the blend of resources that will be consumed by the test. The models presented here are useful in the real world design of reliability tests because of the ease of arriving at cost estimates and the existing availability of statistical distributional information on truncated sequential tests. The test parameters of sample size, number of spares, and duration of the test are amenable to optimization for reduction in the cost of reliability acceptance testing. When the various costs associated with the test are known, and the pdf and Sf of failures and/or time to test termination are defined, then minimum s-expected test costs are achievable. Constraints and sensitivity analysis can be applied to the models to assist the managerial decision process.
Keywords :
Chromium; Cost function; Engineering management; Equations; Optimization methods; Reliability engineering; Resource management; Sensitivity analysis; Sequential analysis; Testing; MIL-STD-781; Minimum cost; Optimization; Truncated sequential test;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1977.5220070
Filename :
5220070
Link To Document :
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