• DocumentCode
    1342383
  • Title

    The Effect of Re-Convergence on SER Estimation in Combinational Circuits

  • Author

    Biwei, Liu ; Shuming, Chen ; Bin, Liang ; Zheng, Liu ; Zhenyu, Zhao

  • Author_Institution
    Sch. of Comput. Sci., Nat. Univ. of Defense Technol., Changsha, China
  • Volume
    56
  • Issue
    6
  • fYear
    2009
  • Firstpage
    3122
  • Lastpage
    3129
  • Abstract
    Detailed analysis is presented on the effect of re-convergence on SER estimation in combinational circuits. The results show that the ignoring of re-convergence by previous independent pulse methods introduces significant errors in SER results. Furthermore, independent pulse methods miscalculate the SET sensitive nodes, leading to improper hardening strategy.
  • Keywords
    SPICE; combinational circuits; ion beam effects; radiation hardening (electronics); SER reconvergence estimation; SET sensitive nodes; SPICE circuit simulation; combinational circuits; hardening strategy; independent pulse methods; ion irradiation effect; soft error rate estimation; Acceleration; Circuit simulation; Combinational circuits; Educational technology; Error analysis; Integrated circuit technology; Logic; Pulse shaping methods; SPICE; Space vector pulse width modulation; Re-convergence; SER estimation; SET;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2034147
  • Filename
    5341359
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1342383