Title :
The Effect of Re-Convergence on SER Estimation in Combinational Circuits
Author :
Biwei, Liu ; Shuming, Chen ; Bin, Liang ; Zheng, Liu ; Zhenyu, Zhao
Author_Institution :
Sch. of Comput. Sci., Nat. Univ. of Defense Technol., Changsha, China
Abstract :
Detailed analysis is presented on the effect of re-convergence on SER estimation in combinational circuits. The results show that the ignoring of re-convergence by previous independent pulse methods introduces significant errors in SER results. Furthermore, independent pulse methods miscalculate the SET sensitive nodes, leading to improper hardening strategy.
Keywords :
SPICE; combinational circuits; ion beam effects; radiation hardening (electronics); SER reconvergence estimation; SET sensitive nodes; SPICE circuit simulation; combinational circuits; hardening strategy; independent pulse methods; ion irradiation effect; soft error rate estimation; Acceleration; Circuit simulation; Combinational circuits; Educational technology; Error analysis; Integrated circuit technology; Logic; Pulse shaping methods; SPICE; Space vector pulse width modulation; Re-convergence; SER estimation; SET;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2034147
