• DocumentCode
    1342419
  • Title

    Electron Nonionizing Energy Loss for Device Applications

  • Author

    Jun, Insoo ; Kim, Wousik ; Evans, Robin

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    56
  • Issue
    6
  • fYear
    2009
  • Firstpage
    3229
  • Lastpage
    3235
  • Abstract
    The electron induced nonionizing energy loss (NIEL) for representative device and detector materials are presented here. The electron NIELs are computed analytically using the Mott differential cross section. As for the partition function, which describes the portion of energy deposited into displacing lattice atoms, the expression recently developed by Akkerman was used that better fits for the low recoil energy.
  • Keywords
    aluminium; energy loss of particles; space vehicle electronics; Lindhard partition function; Mott differential cross section; aluminum shields; damage dose; detector materials; electron induced nonionizing energy loss; recoil energy; space missions; Atomic layer deposition; Detectors; Electrons; Energy loss; Jupiter; Optical materials; Protons; Semiconductor materials; Space missions; Space technology; Lindhard partition function; Mott cross section; nonionizing energy loss (NIEL);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2033692
  • Filename
    5341364
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1342419