Title :
Statistical Model Selection for TID Hardness Assurance
Author :
Ladbury, R. ; Gorelick, J.L. ; McClure, S.S.
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We investigate model dependence of bounding estimates of TID degradation as a function of sample size and statistical model and develop a method for selecting the model with greatest predictive power.
Keywords :
Bayes methods; dosimetry; integrated circuit reliability; quality assurance; radiation hardening (electronics); Bayesian methods; Total Ionizing Dose degradation; quality assurance; radiation effects; radiation hardness assurance; reliability estimation; statistical model; Degradation; Design engineering; Foundries; Ionizing radiation; NASA; Predictive models; Qualifications; Quality assurance; Statistical analysis; Testing; Radiation effects; quality assurance; reliability estimation;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2033691
