Title :
Editorial Conference Comments by the General Chairman
Author_Institution :
Aerosp. Corp., Albuquerque, NM, USA
Abstract :
This paper tells about the comments given by the general chairman in the 2009 conference at Quebec City´s Hilton and convection centre in the province of Quebec, canada. NSREC is recoginized as one of the premier international conference on radiation effects in electronic materials, devices and systems. Also the radiation effects in microelectronic devices and materials are discussed. Reliability effects in electronic device is also given in the conference.
Keywords :
integrated circuit reliability; integrated circuit testing; radiation effects; semiconductor device reliability; editorial conference comments; electronic materials; general chairman; microelectronic devices; radiation effects; reliability effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2035395
