DocumentCode
1342608
Title
An Evaluation of An Ultralow Background Alpha-Particle Detector
Author
Gordon, Michael S. ; Heidel, David F. ; Rodbell, Kenneth P. ; Dwyer-McNally, Brendan ; Warburton, William K.
Author_Institution
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
56
Issue
6
fYear
2009
Firstpage
3381
Lastpage
3386
Abstract
XIA has provided IBM with a prototype ultralow background alpha particle counter for evaluation. Results show a significant decrease in background compared to other commercial counters allowing for rapid measurement of low-emissivity materials.
Keywords
alpha-particle detection; ionisation chambers; IBM; ionization counter; low-emissivity materials; prototype ultralow background alpha particle counter; ultralow background alpha-particle detector; Alpha particles; Counting circuits; Detectors; Ionization; Lead; Packaging; Pollution measurement; Prototypes; Semiconductor materials; Tin; Alpha-particle detector; electronic signal rejection; ionization counter; low background;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2009.2034001
Filename
5341392
Link To Document