• DocumentCode
    1342608
  • Title

    An Evaluation of An Ultralow Background Alpha-Particle Detector

  • Author

    Gordon, Michael S. ; Heidel, David F. ; Rodbell, Kenneth P. ; Dwyer-McNally, Brendan ; Warburton, William K.

  • Author_Institution
    IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    56
  • Issue
    6
  • fYear
    2009
  • Firstpage
    3381
  • Lastpage
    3386
  • Abstract
    XIA has provided IBM with a prototype ultralow background alpha particle counter for evaluation. Results show a significant decrease in background compared to other commercial counters allowing for rapid measurement of low-emissivity materials.
  • Keywords
    alpha-particle detection; ionisation chambers; IBM; ionization counter; low-emissivity materials; prototype ultralow background alpha particle counter; ultralow background alpha-particle detector; Alpha particles; Counting circuits; Detectors; Ionization; Lead; Packaging; Pollution measurement; Prototypes; Semiconductor materials; Tin; Alpha-particle detector; electronic signal rejection; ionization counter; low background;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2034001
  • Filename
    5341392