• DocumentCode
    1342626
  • Title

    Clock and Reset Transients in a 90 nm RHBD Single-Core Tilera Processor

  • Author

    Cabanas-Holmen, M. ; Cannon, E.H. ; Kleinosowski, A. ; Ballast, J. ; Killens, J. ; Socha, J.

  • Author_Institution
    Boeing Co., Seattle, WA, USA
  • Volume
    56
  • Issue
    6
  • fYear
    2009
  • Firstpage
    3505
  • Lastpage
    3510
  • Abstract
    A complex processor was synthesized using an RHBD cell library and fabricated in a commercial 90 nm CMOS technology. Single Event Effects testing revealed transients on the clock and global reset signals. These critical circuits will receive additional hardening in the next prototype design.
  • Keywords
    CMOS integrated circuits; clocks; integrated circuit design; integrated circuit modelling; microcomputers; CMOS technology; RHBD cell library; Radiation Hardened by Design techniques; additional hardening; clock reset signals; complex processor; critical circuits; global reset signals; prototype design; single event effects; single-core Tilera processor; Circuit testing; Clocks; Flip-flops; Libraries; Logic testing; Prototypes; Radiation hardening; Random access memory; Single event upset; Clock transient; flip-flop; radiation effects; reset transient; single event transient (SET); single event upset (SEU);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2034314
  • Filename
    5341395
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1342626