• DocumentCode
    1342688
  • Title

    Flip-Flop Upsets From Single-Event-Transients in 65 nm Clock Circuits

  • Author

    Wissel, Larry ; Heidel, David F. ; Gordon, Michael S. ; Rodbell, Kenneth P. ; Stawiasz, Kevin ; Cannon, Ethan H.

  • Author_Institution
    IBM Syst. & Technol. Group, Essex Junction, VT, USA
  • Volume
    56
  • Issue
    6
  • fYear
    2009
  • Firstpage
    3145
  • Lastpage
    3151
  • Abstract
    This paper describes upsets of 65 nm flip-flops caused by Single-Event-Transients in clock-tree circuits. The upset rate is predicted through modeling, and compared to upset rates measured on a 65 nm test chip with 15 MeV carbon ions and 148 MeV protons.
  • Keywords
    clocks; flip-flops; carbon ions; clock circuits; clock-tree circuits; electron volt energy 148 MeV; electron volt energy 15 MeV; flip-flop upsets; protons; single-event-transients; size 65 nm; Circuits; Clocks; Flip-flops; Master-slave; Neutrons; Packaging; Predictive models; Protons; Semiconductor device measurement; Testing; Flip-flop; single-event transient; soft error;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2033997
  • Filename
    5341403
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1342688