Title :
A Method for Estimating the Reliability of ICS
Author :
Alexanian, I.T. ; Brodie, D.E.
Author_Institution :
Moscow Institute of Electronic Technology; Zelenograd 103460; Moscow USSR.
Abstract :
This theoretical paper suggests using available statistical information and the physics of failure mechanisms together with computerized simulation to estimate and predict time-to-failure or failure rates for highly reliable ICs. The statistical data required for long term testing are derived from the physics-of-failure and computer simulation.
Keywords :
Costs; Degradation; Failure analysis; Information analysis; Microelectronics; Physics; Predictive models; Probability; Quality control; Testing; IC; Physics of failure; Theory;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1977.5220203
