• DocumentCode
    1343288
  • Title

    Bayesian Lower Bounds on Reliability for the Lognormal Model

  • Author

    Padgett, W.J. ; Wei, L.J.

  • Author_Institution
    Department of Mathematics and Computer Science; University of South Carolina; Columbia, South Carolina 29208 USA.
  • Issue
    2
  • fYear
    1978
  • fDate
    6/1/1978 12:00:00 AM
  • Firstpage
    161
  • Lastpage
    165
  • Abstract
    Bayesian lower bounds for the reliability function are obtained for the lognormal failure model with respect to the s-normal-gamma (conjugate) prior distribution and a vague prior distribution of Jeffreys. The Bayesian lower bound with respect to the vague prior is the same as the uniformly most accurate (UMA) lower s-confidence bound for reliability. All lower bounds are given in terms of the noncentrality parameter of a generalized noncentral t-distribution. A simple approximation for the noncentrality parameter is discussed. Computer simulation results indicate how well the approximation performs and provide a performance comparison between the Bayes lower bounds with respect to the (proper) s-normal-gamma prior and the UMA lower s-confidence bound. The two measures used in the simulations to evaluate performance of the lower bounds are 1) the average difference between the computed lower bound and the true reliability and 2) the fraction of computed lower bounds which are actually less than the true reliability. This Bayes procedure performs very well even though the assumed prior information is not exactly correct; and the approximation is used to obtain the lower bounds.
  • Keywords
    Art; Bayesian methods; Computational modeling; Knowledge engineering; Life estimation; Life testing; Probability; Reliability engineering; Reliability theory; Statistical distributions; Bayesian lower bounds; Lognormal failure model; Uniformly most accurate lower s-confidence bound; Vague prior; s-Normal-gamma priors;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1978.5220294
  • Filename
    5220294