• DocumentCode
    1343579
  • Title

    A numerical model of GaAs MESFETs including energy balance for microwave applications

  • Author

    Yoganathan, S. ; Banerjee, S. ; Itoh, T. ; Shichijo, H. ; El-Ghazaly, S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
  • Volume
    1
  • Issue
    7
  • fYear
    1991
  • fDate
    7/1/1991 12:00:00 AM
  • Firstpage
    175
  • Lastpage
    177
  • Abstract
    A novel decoupled solver has been developed that allows larger time steps than conventional decoupled Gummel algorithms and is less central processing unit (CPU) memory and time intensive than coupled Newton solvers. The order in which the quasi-hydrodynamic equations are solved exploits the large difference between the energy relaxation time, (typically 0.5 ps), and the dielectric relaxation time, tau /sub d/ (10 fs). The new decoupled scheme is numerically stable for time steps as large as 20* tau /sub d/. This makes it possible to reduce Cray Y-MP CPU times by 5-7 times compared to those required by conventional Gummel algorithms. This algorithm allows efficient analysis of GaAs MESFETs to study phenomena such as carrier heating near the drain, Gunn domain formation, and carrier injection into the semi-insulating substrate.<>
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; electronic engineering computing; gallium arsenide; semiconductor device models; solid-state microwave devices; Cray Y-MP CPU times; GaAs; Gunn domain formation; MESFETs; carrier heating; carrier injection; decoupled solver; dielectric relaxation time; energy balance; energy relaxation time; microwave applications; numerical model; semi-insulating substrate; semiinsulating substrate; Cutoff frequency; Distributed decision making; Gallium arsenide; MESFETs; Microwave devices; Nonlinear equations; Numerical models; Poisson equations; Semiconductor process modeling; Steady-state;
  • fLanguage
    English
  • Journal_Title
    Microwave and Guided Wave Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1051-8207
  • Type

    jour

  • DOI
    10.1109/75.84574
  • Filename
    84574