Title :
A Low Noise Sub-Sampling PLL in Which Divider Noise is Eliminated and PD/CP Noise is Not Multiplied by
Author :
Gao, Xiang ; Klumperink, Eric A M ; Bohsali, Mounir ; Nauta, Bram
Author_Institution :
IC-Design group, Univ. of Twente, Enschede, Netherlands
Abstract :
This paper presents a 2.2-GHz low jitter sub-sampling based PLL. It uses a phase-detector/charge-pump (PD/CP) that sub-samples the VCO output with the reference clock. In contrast to what happens in a classical PLL, the PD/CP noise is not multiplied by N 2 in this sub-sampling PLL, resulting in a low noise contribution from the PD/CP. Moreover, no frequency divider is needed in the locked state and hence divider noise and power can be eliminated. An added frequency locked loop guarantees correct frequency locking without degenerating jitter performance when in lock. The PLL is implemented in a standard 0.18- ¿m CMOS process. It consumes 4.2 mA from a 1.8 V supply and occupies an active area of 0.4 à 0.45 mm2. With a frequency division ratio of 40, the in-band phase noise at 200 kHz offset is measured to be -126 dBc/Hz. The rms PLL output jitter integrated from 10 kHz to 40 MHz is 0.15 ps.
Keywords :
CMOS integrated circuits; UHF oscillators; charge pump circuits; circuit noise; frequency locked loops; phase detectors; phase locked loops; phase noise; voltage-controlled oscillators; CMOS process; PD-CP noise; VCO output sampling; charge-pump circuit; current 4.2 mA; divider noise elimination; frequency 10 kHz to 40 MHz; frequency locked loop; low-noise subsampling PLL; phase-detector; size 0.18 mum; time 0.15 ps; voltage 1.8 V; CMOS process; Charge pumps; Clocks; Frequency conversion; Frequency locked loops; Frequency measurement; Jitter; Phase locked loops; Phase noise; Voltage-controlled oscillators; Clock generation; clock multiplier; clocks; frequency multiplication; frequency synthesizer; jitter; loop noise; low jitter; low phase noise; low power; phase detector; phase locked loop (PLL); phase noise; sampling phase detector; sub-sampling phase detector; timing jitter;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2009.2032723