Title :
A Confidence Interval for the Barlow-Scheuer Reliability Growth Model
Author_Institution :
6200 Farstar Place; Columbia, MD 21045 USA.
Abstract :
Barlow & Scheuer proposed a useful scheme for estimating reliability growth of a system undergoing developmental testing and offered a conservative lower s-confidence bound. This paper shows how a less conservative lower s-confidence bound can be found by using an equivalent model for system reliability.
Keywords :
Maximum likelihood detection; Maximum likelihood estimation; Missiles; Probability; Prototypes; Reliability theory; State estimation; Statistical analysis; System testing; Barlow-Scheuer growth model; Reliability estimators; Reliability growth modeling; s-Confidence intervals;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1978.5220395
