DocumentCode :
1343970
Title :
Scaled boundary finite element approach for waveguide eigenvalue problem
Author :
Lin, G. ; Liu, Jiangchuan ; Li, Jie ; Fang, Haiyang
Author_Institution :
Fac. of Infrastruct. Eng., Dalian Univ. of Technol., Dalian, China
Volume :
5
Issue :
12
fYear :
2011
Firstpage :
1508
Lastpage :
1515
Abstract :
The scaled boundary finite element method (SBFEM) is developed for the solution of waveguide eigenvalue problems, which combines the advantages of the finite element method and the boundary element method. A new variational principle formulation to derive the SBFEM equations for waveguide is developed. An equation of the dynamic stiffness matrix for waveguide representing the relationship between the `flux` and the longitudinal field components at the discretised boundary is established. A continued fraction solution in terms of eigenvalue is obtained. By using the continued fraction solution and introducing auxiliary variables, the flux`longitudinal field relationship is formulated as a system of linear equations in eigenvalue then a generalised eigenvalue equation is obtained. The eigenvalues of rectangular, L-shaped, vaned rectangular and quadruple corner-cut ridged square waveguides are calculated and compared with analytical solution and other numerical methods. The results show that the present method yields excellent results, high precision and less computational time and rapid convergence is observed.
Keywords :
boundary-elements methods; eigenvalues and eigenfunctions; finite element analysis; ridge waveguides; L-shaped waveguide; boundary element method; continued fraction solution; discretised boundary; dynamic stiffness matrix; flux; generalised eigenvalue equation; linear equation; longitudinal field component; quadruple corner-cut ridged square waveguide; scaled boundary finite element approach; vaned rectangular waveguide; variational principle formulation; waveguide eigenvalue problem;
fLanguage :
English
Journal_Title :
Microwaves, Antennas & Propagation, IET
Publisher :
iet
ISSN :
1751-8725
Type :
jour
DOI :
10.1049/iet-map.2010.0565
Filename :
6036228
Link To Document :
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