Title :
Optimal Allocation of Fault Detectors
Author :
Takami, I. ; Inagaki, T. ; Sakino, E. ; Inoue, K.
Author_Institution :
Takasago Technical Institute; Mitsubishi Heavy Industries, Ltd.; 2-1-1 Shinhama, Araicho; Takasago 676 JAPAN.
Abstract :
A Markov model is given for a class of series systems which have fault detectors to find component failures. The optimal allocation of fault detectors is determined. This problem is a nonlinear 0-1 integer programming (0-1 IP) problem. The problem is solved easily because the nonlinearity is of a special type. An illustrative example is given.
Keywords :
Costs; Detectors; Fault detection; Linear programming; Maintenance engineering; Markov processes; Process planning; Reliability engineering; Reliability theory; Steady-state; 0-1 integer program; Detector allocation; Markov model; Optimization;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1978.5220421
