Title :
Sensitivity Analysis of k-Fold Cross Validation in Prediction Error Estimation
Author :
Rodríguez, Juan Diego ; Pérez, Aritz ; Lozano, Jose Antonio
Author_Institution :
Comput. Sci. Fac., Univ. of the Basque Country (UPV-EHU), San Sebastian, Spain
fDate :
3/1/2010 12:00:00 AM
Abstract :
In the machine learning field, the performance of a classifier is usually measured in terms of prediction error. In most real-world problems, the error cannot be exactly calculated and it must be estimated. Therefore, it is important to choose an appropriate estimator of the error. This paper analyzes the statistical properties, bias and variance, of the k-fold cross-validation classification error estimator (k-cv). Our main contribution is a novel theoretical decomposition of the variance of the k-cv considering its sources of variance: sensitivity to changes in the training set and sensitivity to changes in the folds. The paper also compares the bias and variance of the estimator for different values of k. The experimental study has been performed in artificial domains because they allow the exact computation of the implied quantities and we can rigorously specify the conditions of experimentation. The experimentation has been performed for two classifiers (naive Bayes and nearest neighbor), different numbers of folds, sample sizes, and training sets coming from assorted probability distributions. We conclude by including some practical recommendation on the use of k-fold cross validation.
Keywords :
Bayes methods; estimation theory; learning (artificial intelligence); pattern classification; probability; statistical analysis; classification error estimator; k-fold cross-validation; machine learning; naive Bayes method; nearest neighbor algorithm; prediction error estimation; probability distribution; sensitivity analysis; statistical properties; bias and variance; decomposition of the variance; error estimation; k-fold cross validation; prediction error; sources of sensitivity; supervised classification.;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2009.187