Title :
A Reparable Multistate Device
Author :
Elsayed, E.A. ; Zebib, A.
Author_Institution :
Department of Mechanical, Industrial and Aerospace Engineering; Rutgers University; POBox 909; Piscataway, NJ 08854 USA.
fDate :
4/1/1979 12:00:00 AM
Abstract :
A device that can assume several states of failure is called a multistate device. Closed form solutions for both the steady-state and time-dependent availability of such a device and probability of failure in state i at any given time t are developed, largely in Laplace Transform form.
Keywords :
Availability; Closed-form solution; Difference equations; Differential equations; Failure analysis; Laplace equations; Performance analysis; Reliability theory; Steady-state; Testing; Multistate device; Time-dependent availability;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1979.5220490
