DocumentCode
1344357
Title
A Reparable Multistate Device
Author
Elsayed, E.A. ; Zebib, A.
Author_Institution
Department of Mechanical, Industrial and Aerospace Engineering; Rutgers University; POBox 909; Piscataway, NJ 08854 USA.
Issue
1
fYear
1979
fDate
4/1/1979 12:00:00 AM
Firstpage
81
Lastpage
82
Abstract
A device that can assume several states of failure is called a multistate device. Closed form solutions for both the steady-state and time-dependent availability of such a device and probability of failure in state i at any given time t are developed, largely in Laplace Transform form.
Keywords
Availability; Closed-form solution; Difference equations; Differential equations; Failure analysis; Laplace equations; Performance analysis; Reliability theory; Steady-state; Testing; Multistate device; Time-dependent availability;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1979.5220490
Filename
5220490
Link To Document