A Theory of Single-Event Transient Response in Cross-Coupled Negative Resistance Oscillators

Author

Horst, Stephen J. ; Phillips, Stanley D. ; Saha, Prabir ; Cressler, John D. ; McMorrow, Dale ; Marshall, Paul

Author_Institution

Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

Volume

57

Issue

6

fYear

2010

Firstpage

3349

Lastpage

3357

Abstract

A theory of the circuit-based response to SET phenomena in resonant tank oscillators is presented. Transients are shown to be caused by a change in the voltage state of the circuit´s characteristic differential equation. The SET amplitude and phase response is derived for arbitrary strike waveforms and shown to be time-variant based on the strike time relative to the period of oscillation. Measurements in the time-domain are used to support the theory, while the frequency-domain is used to gauge potential impact on system performance. A design-oriented analysis of the relevant trade-offs is also presented.

Keywords

circuit resonance; differential equations; frequency-domain analysis; negative resistance circuits; nuclear electronics; oscillators; time-domain analysis; transient response; waveform analysis; circuit-based response theory; cross-coupled negative resistance oscillator; design-oriented analysis; differential equation; frequency-domain analysis; resonant tank oscillator; single-event transient response theory; time-domain analysis; Heterojunction bipolar transistors; Microwave oscillators; Radiation effects; Silicon germanium; Transient analysis; Voltage-controlled oscillators; HBT; SiGe; VCO; microwave oscillators; radiation effects; radiation hardening; silicon-germanium;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2010.2076834

Filename

5595523