Title :
Correction factor for determining the London penetration depth from strip resonators
Author :
Romanofsky, R.R.
Author_Institution :
NASA Lewis Res. Center, Cleveland, OH, USA
fDate :
3/1/1998 12:00:00 AM
Abstract :
The strip resonator technique is a popular way to measure the temperature (T)-dependent London penetration depth /spl lambda//sub L/(T) in superconducting thin films. The temperature dependence can provide fundamental information about the superconducting energy gap and hence insight into the pairing mechanism. Since /spl lambda//sub L/(T) characterizes the film´s response to a magnetic field near the surface, it qualifies the suitability of the superconducting film for microwave device applications. There has been much controversy regarding the actual form of the temperature dependency, with some researchers reporting a weak-coupled Bardeen-Cooper-Schriefer (BCS)-like behavior and others favoring a Gorter-Casimir type fit. This paper shows that the disagreement can be at least partially attributed to a temperature sensitive term traceable to stray susceptance coupled into the resonator. The effect is inherent to the technique, but a simple procedure to compensate for it can be used and is presented here as a correction factor (1+/spl xi/).
Keywords :
equivalent circuits; error compensation; high-temperature superconductors; measurement errors; microwave measurement; penetration depth (superconductivity); superconducting energy gap; superconducting microwave devices; superconducting resonators; superconducting thin films; HTSC film; London penetration depth; compensation procedure; correction factor; microwave device applications; pairing mechanism; stray susceptance; strip resonator technique; superconducting energy gap; superconducting thin films; temperature dependence; temperature sensitive term; High temperature superconductors; Impedance; Inductance; Resonant frequency; Strips; Superconducting microwave devices; Superconducting transmission lines; Temperature dependence; Temperature sensors; Transmission line theory;
Journal_Title :
Applied Superconductivity, IEEE Transactions on