• DocumentCode
    1345027
  • Title

    Analysis of ionospheric electron density distribution from GPS/MET occultations

  • Author

    Rius, Antonio ; Ruffini, Giulio ; Romeo, August

  • Author_Institution
    CSIC Res. Unit, Inst. d Estudis Espacials de Catalunya, Barcelona, Spain
  • Volume
    36
  • Issue
    2
  • fYear
    1998
  • fDate
    3/1/1998 12:00:00 AM
  • Firstpage
    383
  • Lastpage
    394
  • Abstract
    The authors present results from analysis of GPS/MET occultation data obtained from the University Corporation for Atmospheric Research database. They have used high-rate occultation data to study the performance of an earlier 4D ionospheric electron content model-obtained tomographically with the use of the GPS constellation-with satisfactory results. In addition, they have processed UCAR level-one medium-rate occultation data by using the GIPSY package to obtain aligned phases. Under the assumption of local spherical symmetry, this phase information has been processed to yield ray-path bending angles through Doppler-shift analysis, which have then been used to yield profiles of electronic density via the Abel transform. These profiles give important information for preparing future tomographic work, although the limitations imposed by the working assumptions in this approach cannot be ignored
  • Keywords
    Global Positioning System; ionosphere; ionospheric techniques; Abel transform; Doppler-shift analysis; GIPSY package; GPS; GPS MET occultation; Global Positioning System; UCAR level-one medium-rate occultation; aligned phases; electron content; electron density distribution; ionosphere; ionospheric structure; measurement technique; ray-path bending angle; tomography; transionospheric signal; Atmospheric modeling; Databases; Delay effects; Electronics packaging; Electrons; Global Positioning System; Ionosphere; Performance analysis; Satellite broadcasting; Tomography;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0196-2892
  • Type

    jour

  • DOI
    10.1109/36.662724
  • Filename
    662724