Title :
Limitations of the pulse-shape technique for particle discrimination in planar Si detectors
Author :
Pausch, G. ; Moszynski, M. ; Bohne, W. ; Cederkäll, J. ; Grawe, H. ; Klamra, W. ; Lampert, M.O. ; Rohr, P. ; Schubart, R. ; Seidel, W. ; Wolski, D.
Author_Institution :
Forschungszentrum Rossendorf Inst. fur Kern, Dresden, Germany
fDate :
6/1/1997 12:00:00 AM
Abstract :
Limitations of the pulse-shape discrimination (PSI) technique-a promising method to identify the charged particles stopped in planar Si-detectors have been investigated. The particle resolution turned out to be basically determined by resistivity functions in the bulk silicon which cause the charge collection time to depend on the point of impact. Detector maps showing these fluctuations have been measured and are discussed. Furthermore we present a simple method to test the performance of detectors with respect to PSD. Another limitation of the PSD technique is the finite energy threshold for particle identification. This threshold is caused by an unexpected decrease of the total charge-collection time for ions with a short range, in spite of the fact that the particle tracks are located in a region of very low electric field
Keywords :
detector circuits; discriminators; fluctuations; nuclear electronics; pulse shaping circuits; silicon radiation detectors; PSD technique; Si; charge collection time; charged particles; finite energy threshold; fluctuations; particle discrimination; particle identification; particle resolution; particle tracks; planar Si detectors; pulse-shape discrimination; pulse-shape technique limitations; resistivity functions; total charge-collection time; very low electric field; Alpha particles; Detectors; Fluctuations; Ionization; Nuclear electronics; Physics; Protons; Pulse measurements; Shape measurement; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
