• DocumentCode
    1345397
  • Title

    Charge deposition distributions in targets irradiated by electrons

  • Author

    Lazurik, Valentin ; Moskvin, Vadim

  • Author_Institution
    Radiation Phys. Lab., Kharkov State Univ., Ukraine
  • Volume
    44
  • Issue
    3
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    1065
  • Lastpage
    1069
  • Abstract
    Charge deposition in targets consisting of materials with atomic numbers from 6 to 92 irradiated by normally impinging broad electron beams with energies from 0.1 to 10 keV is studied. Using the modification of trajectory rotation method [Nucl. Instr. and Meth. B 108 (1996) 276], the data on primary electron charge deposition distributions in the targets are obtained. The mechanism of charge deposition distribution shaping in small-size spatial regions in a target is analyzed. The role of stochastic wandering of electrons in charge deposition near inhomogeneities in a target is discussed. It is noted that ignoring the electron stochastic wandering may lead to artifacts in calculations and erroneous conclusions about charge deposition near interfaces in heterogeneous targets
  • Keywords
    Monte Carlo methods; charge exchange; electron beam effects; energy loss of particles; stochastic processes; 0.1 to 10 MeV; broad electron beams; charge deposition distributions; electron irradiated targets; electron stochastic wandering; heterogeneous targets; inhomogeneities; primary electron charge deposition distributions; stochastic wandering; targets; Atomic beams; Atomic layer deposition; Atomic measurements; Data analysis; Electron beams; Fitting; Laboratories; Monte Carlo methods; Physics; Stochastic processes;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.603805
  • Filename
    603805