• DocumentCode
    1345432
  • Title

    A continuous compact MOSFET model for fully- and partially-depleted SOI devices

  • Author

    Sleight, Jeffrey W. ; Rios, Rafael

  • Author_Institution
    Technol. Dev. Group, Digital Semiconductor, Hudson, MA, USA
  • Volume
    45
  • Issue
    4
  • fYear
    1998
  • fDate
    4/1/1998 12:00:00 AM
  • Firstpage
    821
  • Lastpage
    825
  • Abstract
    A fully continuous compact SOI MOSFET model for circuit simulations, that automatically accounts for the for the correct body depletion condition, is presented. Unlike previously reported models that are derived for either fully-depleted (FD) or partially-depleted (PD) devices, our model accounts for the possible transitions between FD and PD behavior during the device operation
  • Keywords
    MOSFET; semiconductor device models; silicon-on-insulator; body depletion; circuit simulation; continuous compact SOI MOSFET model; fully-depleted device; partially-depleted device; Body regions; Circuit simulation; Doping; Electrostatics; MOS devices; MOSFET circuits; Poisson equations; Semiconductor process modeling; Substrates; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.662786
  • Filename
    662786