• DocumentCode
    1345800
  • Title

    Accelerated Life Testing - Step-Stress Models and Data Analyses

  • Author

    Nelson, Wayne

  • Author_Institution
    Bldg. 37, Rm. 578; G.E. Research & Development; Schenectady, NY 12345 USA.
  • Issue
    2
  • fYear
    1980
  • fDate
    6/1/1980 12:00:00 AM
  • Firstpage
    103
  • Lastpage
    108
  • Abstract
    This paper presents statistical models and methods for analyzing accelerated life-test data from step-stress tests. Maximum likelihood methods provide estimates of the parameters of such models, the life distribution under constant stress, and other information. While the methods are applied to the Weibull distribution and inverse power law, they apply to many other accelerated life test models. These methods are illustrated with step-stress data on time to breakdown of an electrical insulation.
  • Keywords
    Acceleration; Data analysis; Insulation testing; Life estimation; Life testing; Maximum likelihood estimation; Reliability theory; Statistical analysis; Stress; Voltage; Accelerated life testing; Cumulative exposure models; Maximum likelihood; Step-stressing;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1980.5220742
  • Filename
    5220742