DocumentCode
1345800
Title
Accelerated Life Testing - Step-Stress Models and Data Analyses
Author
Nelson, Wayne
Author_Institution
Bldg. 37, Rm. 578; G.E. Research & Development; Schenectady, NY 12345 USA.
Issue
2
fYear
1980
fDate
6/1/1980 12:00:00 AM
Firstpage
103
Lastpage
108
Abstract
This paper presents statistical models and methods for analyzing accelerated life-test data from step-stress tests. Maximum likelihood methods provide estimates of the parameters of such models, the life distribution under constant stress, and other information. While the methods are applied to the Weibull distribution and inverse power law, they apply to many other accelerated life test models. These methods are illustrated with step-stress data on time to breakdown of an electrical insulation.
Keywords
Acceleration; Data analysis; Insulation testing; Life estimation; Life testing; Maximum likelihood estimation; Reliability theory; Statistical analysis; Stress; Voltage; Accelerated life testing; Cumulative exposure models; Maximum likelihood; Step-stressing;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1980.5220742
Filename
5220742
Link To Document