DocumentCode :
1345800
Title :
Accelerated Life Testing - Step-Stress Models and Data Analyses
Author :
Nelson, Wayne
Author_Institution :
Bldg. 37, Rm. 578; G.E. Research & Development; Schenectady, NY 12345 USA.
Issue :
2
fYear :
1980
fDate :
6/1/1980 12:00:00 AM
Firstpage :
103
Lastpage :
108
Abstract :
This paper presents statistical models and methods for analyzing accelerated life-test data from step-stress tests. Maximum likelihood methods provide estimates of the parameters of such models, the life distribution under constant stress, and other information. While the methods are applied to the Weibull distribution and inverse power law, they apply to many other accelerated life test models. These methods are illustrated with step-stress data on time to breakdown of an electrical insulation.
Keywords :
Acceleration; Data analysis; Insulation testing; Life estimation; Life testing; Maximum likelihood estimation; Reliability theory; Statistical analysis; Stress; Voltage; Accelerated life testing; Cumulative exposure models; Maximum likelihood; Step-stressing;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1980.5220742
Filename :
5220742
Link To Document :
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