DocumentCode
1346042
Title
A new cryogenic CMOS readout structure for infrared focal plane array
Author
Hsieh, Chih-Cheng ; Wu, Chung-Yu ; Sun, Tai-Ping
Author_Institution
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume
32
Issue
8
fYear
1997
fDate
8/1/1997 12:00:00 AM
Firstpage
1192
Lastpage
1199
Abstract
A new current readout structure for the infrared (IR) focal-plane-array (FPA), called the switch-current integration (SCI) structure, is presented in this paper. By applying the share-buffered direct-injection (SBDI) biasing technique and off focal-plane-array (off-FPA) integration capacitor structure, a high-performance readout interface circuit for the IR FPA is realized with a pixel size of 50×50 μm2. Moreover, the correlated double sampling (CDS) stage and dynamic discharging output stage are utilized to improve noise and speed performance of the readout structure under low power dissipation. In experimental SCI readout chip has been designed and fabricated in 0.8-μm double-poly-double-metal (DPDM) n-well CMOS technology. The measurement results of the fabricated readout chip at 77 K with 4 and 8 V supply voltages have successfully verified both the readout function and the performance improvement. The fabricated chip has a maximum charge capacity of 1.12×108 electrons, a maximum transimpedance of 1×109 Ω, and an active power dissipation of 30 mW. The proposed CMOS SCI structure can be applied to various cryogenic IR FPA´s
Keywords
CMOS integrated circuits; cryogenic electronics; focal planes; infrared imaging; switched current circuits; 0.8 micron; 30 mW; 4 V; 50 micron; 77 K; 8 V; charge capacity; correlated double sampling; cryogenic CMOS readout; double-poly-double-metal n-well CMOS chip; dynamic discharging; infrared focal plane array; interface circuit; off-FPA integration capacitor; power dissipation; share-buffered direct-injection biasing; switch-current integration; transimpedance; CMOS technology; Circuit noise; Cryogenics; Infrared detectors; Power dissipation; Sampling methods; Semiconductor device measurement; Sun; Switched capacitor circuits; Voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.604075
Filename
604075
Link To Document