Author_Institution :
Inst. of Administration and Management; Union College; Schenectady, N.Y. 12308 USA.
Abstract :
s-Confidence limits have already been generated for accept/reject plans in MIL-STD-781C.
Keywords :
Educational institutions; Interpolation; Reliability engineering; Reliability theory; Statistics; Testing; Editorial; MIL-STD-781C; s-Confidence;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1980.5220805
